Presenter

Sergei Rouvimov
Research Associate Professor, Electrical Engineering
TEM Program Director, ND Integrated Imaging Facility

Abstract

Recent advances in transmission electron microscopy (TEM) now make this technique even more attractive to a wide variety of scientists, including materials scientists, chemists, physicists, and biologists. While significant improvements in electron optics (aberration correction) and electron sources (monochromatic, high intensity electron sources with high coherency) allowed visualization of individual atoms, the recent development of high-sensitivity electron detectors (including direct detectors such as K2 and K3 Gatan CMOS cameras) have brought TEM to a new level in imaging of sensitive materials (such as bio-materials, polymers, oxides, etc). This makes Cryo-TEM easier and creates a great potential for electron spectroscopy such as EELS.